Borescope Inspection Procedure Pdf 61
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The MX61L/ MX61, 300 mm/ 200 mm semiconductor inspection microscope provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence and infrared.
The 300mm manual XY stage is capable of both coarse and fine stage movements by using the built-in clutch mechanism and XY knobs. Using the clutch, the operator can freely move the stage while performing inspections.
The objective is the core part of the optical microscope, used for the illumination and observation of material science samples. Olympus has the widest choice of objectives, universal objectives suitable for all contrast methods, long and ultra long working distance objectives, near-infrared objectives, LCD inspection objectives and many more.
The rotational speed of the motorized nosepieces are ultra-fast, decreasing time between inspections while maintaining clean room compatibility. Olympus offers three variations for desired inspection methods controlled via software, frame button or independent handset.
The integrated motorized aperture stop automatically adjusts for the objective lens in use. Thus the best image quality for every magnification is achieved, making routine inspections more comfortable for the eyes and more efficient for the operator.
The specially designed IR objective lenses and components are ideal for imaging features and defects beneath the surface of silicon and glass. The Semiconductor and Photovoltaic industries use IR imaging for alignment, identification of sub-surface contamination and critical dimension inspections. The 20x, 50x and 100x objectives are designed with a correction collar that corrects for the aberrations caused by the thickness of silicon and glass, improving overall contrast. Olympus supports several IR digital cameras for near infrared imaging and analysis.
Transmitted light can be added to the MX61L/ MX61 for photo-mask or flat panel display inspections. Two types are available, one with a universal condenser and a second type with a high numerical aperture. Both support simple polarized light. Transmitted light can be added to the MX61 for photo-mask or flat panel display inspections. Two types are available, one with a universal condenser, MX-TILLA, and a second type with a high numerical aperture, MX-TILLB. Both support simple polarized light.
3 Dimensional ViewingThe optimum inward angle allows just the right combination of high level flatness and depth of focus for 3D viewing. Even a specimen with significant depth can be brought into focus from top to bottom for faster inspection
For inspection or assembly of larger samples Olympus offers a variety of boom stands which are adjustable and ESD safe. Large platform stands are also available and if required, can accept auxillary posts of 400mm and 600mm.
Apparatus, instruments, implements, or processes that are either specially adapted or intended to be solely utilised for medical procedures employing physical actions (e.g. laser cutting, pressure of fluid) on portions of human or animal bodies to correct, enhance, or inspect (e.g. autopsies) them for medical purposes (i.e. surgery). Surgery consists of the following medical procedures:
Apparatus, instruments, implements, or processes that are either specially adapted or intended to be solely utilised in procedures for identifying individual human beings (e.g. finger printing, by recognition of shape or dimension of body part) using unique characteristics of their bodies (i.e. identification). Adjunct or supplementary means specially adapted for use in, or intended for exclusive use in, diagnosis, surgery, or identification. These adjunct or supplementary means contribute to the effectiveness (e.g. surgical drapes) or safety (e.g. operating gloves) of a medical procedure, but may or may not (e.g. protective covers for scalpels) themselves involve any direct contact with a body.
The method of observing the condition of the insulation layer with visual inspection and also themethod of measuring the thermal conduction or resistance of the insulation layer, of the buildingelements such as exterior wall, floor, ceiling, etc. (hereinafter, walls) in the field is described.The proposed method is divided into the quantitative method which measures the thermal resistanceand the thermal conductivity with the heat flow measurement, and the qualitative method without heatflow measurement. The former quantitative method can apply not only the insulation layer but alsowhole throughout wall.This document especially aims to test the furnished insulation layer in the walls. It demonstrates ascreening test with drilling a small diameter borehole through the walls with the presumed insulationlayer. Visual inspection with a borescope and measuring the temperature distribution by inserting thetemperature sensor, the qualitative futures of the insulation layer is evaluated. Adding themeasurement of the heat flow rate, thermal conductance (resistance) is quantitively evaluated. 2b1af7f3a8